Photoelastic Modulator Based Precision Measurement System

Photoelastic Modulator (PEM)
Low Level Birefringence Measurement System
  Visible light to Deep UV
  Quality control metrology
  Low-level birefringence measurements of Plate glass, Scientific optical components, Laser crystals, DVDs
  Qualification of semiconductor photolithography components including Calcium fluoride windows for
    operation at 193 nm and below, Fused silica optical components, Stepper reticles