Wafer & Substrate Probe Stations & Accessories

DC to 330 GHz
Stable probe station can reduce expendables used and prevent wafer scraped
Independent cal and wafer chuck Z & θ
Five levels configurations to choose from Manual, Motorized, Joystick programmable, Software programmable and
    Semi-Automatic. Can upgrade when you need, and just upgrade in your LAB
High performance thermal chuck system. The fastest transition times in the industry
Coolant temperature never exceeds 20 ºC. Temperature ranges as high as 600 ºC
 

Auriga Measurement System

 

Precision Load Pull (PLP) Measurement System

Load Pull Legacy Hardware and Software Upgrade Package

Precision Noise Parameters (PNP) Measurement System

NP5 Software Upgrade Package

Pulsed IV (PIV) Measurement System - the highest current and voltage system available

Component Test System (CTS) - Integrated Module and MMIC Test Solution

High Current Bias Tees

Characterization, Modeling and Design services

   Small signal 0-50GHz

   Large signal 0-110GHz

   Load pull, single and multi-tone signal drive

   Noise

Tuner based Load and Source Pull Measurement system - Smart Tuner®

 

A new state-of-art automatic tuner for the Wireless Industry.

Fast tuning speed, high matching range and high power capability.

Sealed and rugged design, ideal for testing environments.

Small footprint and ease installation, a real benefit on any crowded bench, a probe station and
    the ever changing equipment sharing problem.

Advanced, user-friendly software.

Wireless Communication System Test Equipment

Carrier to Noise Generator - Precision BER versus C/N Testing using AWGN
White Gaussian Noise Generator
Satellite to Ground Station RF Link Emulator
Frequency Synthesizer - HF to 30GHz, Low Noise, 1 Hz Resolution
Multi-channel Broad Band Solid State Attenuator
Frequency Converters
RF Interfaces.

 

　

Optical Microscopes & Video Systems

Optical and Video Systems and accessories
A-Zoom Microscope
Confocal Microscope

Broadband Interconnect Characterization Systems & Services

Fixtures, probes, probes stations, Network Analyzers, TDRs and analysis software.
Measurements for verification and modeling of components such as connectors,
     IC packages, circuit boards, test sockets and passives.
Signal integrity curriculum including introductory and advanced design classes.


(For Taiwan Market Only)

High-Speed Singal Generation and Test & Measurement Equipment

TDR Instrument
    Provides differential and common mode 9ps TDR and 7ps TDT incident pulses.
    Enables increased resolution for TDR analysis of high-speed interconnects and circuits
    Improve TDR risetime
Pulse Generator
    Rise times as low as 5ps for time domain
    Step pulse, impulse waveform output application
Coaxial Components
    Bias Tees and DC Blocks provide excellent frequency and time domain response.
    Attenuators - Provide frequency response up to 60GHz.
    Low Pass Filters - Provide standard and custom absorptive filters.
    Power Dividers and Pick-Off Tees - Provide broadband device to combine and split signals up to 40GHz.

Real Time Load Pull and Multi-port Measurement System


Dragon Real Time Load Pull System - Expand traditional tuner system up to real time active test set.
   Use VNA to measure RF parameters, real vector information with much higher accuracy.
   No more cumbersome tuner characterization, greatly saving measurement preparation.
   Ultra Low Loss Head provides high RF directional couple with loss only 0.05dB at 2GHz.
   Compatible with all branches of automatic and manual tuners.
Multi-port Measurement System - Expand a 2-port VNA to a multi-port network analyzer.
   Automatic create calibration procedure with minimum cal. standard.
   Basic module, Dual module and Hub module to combine up to 64-port system.

 

Automatic, Accelerated, Reliability Test System


DC-18GHz, 60W RF device lifetest, includes stress and measurement.
   Stress temperature range: 50 °C to > 250 °C, stability of +/- 2 °C.
   Advanced multi-dimensional dynamic lifttest algorithm.
   32 RF Devices with individual DC Bias control, independent RF power level, and independent thermal control.
   Embedded third-party parametric analyzer, custom characterization and benchmarking.
   Simple user interface, collect and export data in raw or graphic.
Idea for SiGe, GaAs, InP, GaN, SiC material RF device.

Manual and Automatic Test Fixtures and Calibration Standards

RF Test Fixtures
    Packaged Devices
    Chip
    Substrate ( Microstrip & Coplanner )
Calibration Kits
Automated RF Device Handler
TDR and RF Probes