Semiconductor Packages

Inter-Continental Microwave offers a highly flexible Universal Semiconductor
Measurement platform which is expandable to characterize active devices such
as microwave transistors, diodes, MMICs, etc., in chip or packaged form.

Universal Test Fixture Mainframe

The system is based on the Adjustable Mainframe Test Fixture.
Interchangeable RF-transitions allow you to set up the usable frequency and

temperature range of the fixture. Current RF-Transition designs cover up to 50
GHz and ¨C55 to +125 degrees C.

Different fixture length and closing mechanisms are standard options.

Midsection Adapters (> 1000 models)

Midsection Adapters are used in the Mainframe to create a custom interface for
each Device Under Test (DUT). These Midsection Adapters allow accurate and
repeatable positioning of the DUT.

Many Midsection Adapters feature field replaceable insert assemblies.

ICM¡¯s proprietary DURA Contacts ensure a long life for the DUT contacts.

Calibration Standards

Calibration Kits may be used to de-embed the Mainframe and Midsection
Adapter from the measurement results in order to obtain accurate data on the
DUT.

TRL and TOSL Calibration Kits are available.

Calibration coefficients are supplied for many Network Analyzer models.

FET, BIPOLAR and MMIC Carrier Assemblies

FET & MMIC Carrier Assemblies use RF-input/output microstrip launches.

The MMIC carrier assemblies have five DC/Control inputs on each side and
bypass capacitors can be added if desired. The Carrier assemblies are available
with 10, 15 or 25 mil substrates.

A midsection holds the carrier during testing.

SOT and SOD Surface Mount Transistors

ICM offers insert assemblies for SOT and SOD Surface Mount packaged
transistors, diodes and MMICs.

Input and output launchers are 25 mil microstrip.

De-embedding with TRL / LRM or TOSL Calibration Standards removes the
effect of the Test Fixture.

A midsection holds the insert during testing.

High Power Transistor Test Fixtures

The ICM High Power Test Fixture can be set up to measure the DUT in a 50
Ohm environment or with matching circuits. Available options include various
connector styles, heatsink with liquid cooling, variety of board material and TRL
Calibration Standards.

The fixture can also be supplied as part of a High Power Test Station for use
with Maury Microwave Tuners.

Saw Filter Test Fixtures

High Isolation Saw Filter Test Fixtures for DUT sizes as small as 2 x 2 mm.

Models with 2, 3 or 4 RF ports are standard. RF connections can be inline or
offset (fully adjustable). Drop-in Calibration Standards are available for all sizes.

Manual Press Style fixtures, as well as, Base units for Automatic Handlers are
available

Surface Mount Capacitor and Inductor Testing

Surface mount chip Capacitors, Inductors or Resistors can be easily measured in
SERIES-THRU or in SHUNT-THRU configurations.

The Test System accommodates component sizes from 0201 to 1206.
ICM DURA contacts are incorporated for long fixture life. De-embedding with
TRL / TOSL Calibration Standards is available.

Laser Transmit and Receive Modules

Test Fixtures with custom pin-outs and full temperature range (-55 to +125
degrees C) are available to make repeatable non-destructive testing of high
performance laser transmit or receive modules.

Single ended or differential inputs/outputs are available.

In addition, Calibration Kits can be supplied for de-embedding of the test fixture.

Universal Substrate Test Fixture

The Series WK-3000 is a highly flexible test platform for assemblies with
microstrip or coplanar inputs and outputs.

The transitions are adjustable in the x, y and z direction. Models with 2, 3 or 4
RF port configurations are standard.

TRL / TOSL Calibration Standards for precise de-embedding from DC-50 GHz.
Many connector styles to choose from.

Coax to Microstrip / Coplanar Transitions

ICM offers a large number of transition assemblies covering DC-50 GHz.

These assemblies are ideal for building engineering-type test fixtures in house.
Choose from APC-7, APC-3.5, 2.4 mm, Super-SMA, K, N, and 7/16 connectors.

Large number of special transitions are also available.

TDR Probes

ICM TDR Probes feature fixed or adjustable ground spacing making them
suitable for multiple applications.

They are designed with Super-SMA connectors and usable to 26.5 GHz.
3.5 mm Calibration Standards can be used with the ICM Calibration Adapters.
The probes are very rugged and field replaceable parts are available.
Custom design upon request.

MMIC and BGA Packages

MMIC and BGA packages can easily be measured with ICM's dedicated test
fixtures and Calibration Standards.

Solutions for leaded, microstrip and surface mount packages with multiple RF
and DC inputs or outputs are available.

Full temperature versions upon request.

Automatic TDR Probers

ICM offers fully programmable automatic probing systems.

The probes can be controlled in 4 axis which gives great versatility.
TDR, RF or DC probes can be interchanged.

High position accuracy guarantees great repeatability and measurement
accuracy. Re-configurations can be done in minimum time to use the system for
different applications.

Automatic Device Handling Systems

ICM offers Automatic Device Handling Systems for device testing at RF and
Microwave frequencies.

Multiple input and output trays are standard, and tested devices can be sorted up
to 10 levels. Interfacing with tape and reel machines upon request.

ICM offers open software for customers to do special customization.

Do it yourself Test Fixture

ICM offers a new low cost flexible engineering lab test fixture for fast
evaluation of microstrip substrates and assemblies.

Two Coax-to-Microstrip Transitions provide accurate launching of microwave
signals to the DUT.

Frequency range is DC - 26.5 GHz.

Center Blocks width (same width as the DUT) from 200 mils to 1500 mils are
available.

2 adjustable DC probes can supply DC to the circuit under test.

Many optional transitions are also available.