Features

. Ideal for S-Parameter Measurements, Q and
   Resonant Frequency

. Up to 26.5 GHz Operation (40 GHz available with
   ICM Midsections and Mainframes)

. De-embedding with TRL / LRM or TOSL
   Standards

. Separate spacers for different sized components [5
   (0603mm), 15 (0402), 20 (0504), 25 (0603), 40
   (0805), 60 (1008), and 80 (1206) mil gaps]

. Spacers for custom components available upon
   request

. Allows repeatable, non-destructive testing

. ICM Dura-Contacts for Long Fixture Life

. Measurement Solution Kits available

. Total Measurement Solution Kit

. Shunt-Thru Configurations are also available

Surface Mount chip capacitors (single or
multi-layered), inductors or resistors can be measured
on Inter-Continental Microwave's (ICM) Surface
Mount Chip Component Test Fixture. The Test
Fixture is designed as a solution for making
measurements in a Series-Thru test configuration.
Input and Output launches are on microstrip material
allowing the customer to select a material that will
match the material used in the end application. Guides
on the fixture ensure accurate and repeatable
placement of the chip. De-embedding with TRL /
LRM or TOSL Calibration Standards removes the
effect of the test fixture from your measurements. For
custom sized devices, please contact the factory.

Features

. Ideal for S-Parameter Measurements, Q and
   Resonant Frequency

. DC-18 or 26.5 GHz Operation

. De-embedding with TRL / LRM or TOSL
   Standards

. Separate Assemblies for different sized components
   [15 (0402), 25 (0603), 38 (0805), 68 (1008), and
   >88 (1206) mil gaps]

. Allows repeatable, non-destructive testing

. ICM Dura Contacts for Long Fixture Life

. Midsection Assembly for custom components
   available upon request

. Complete Test Solutions available (see table)

. Total Measurement Solution Kit

. Series-Thru Configurations are also available

Surface Mount chip capacitors (single or
multi-layered), inductors or resistors can be measured
on Inter-Continental Microwave's (ICM) Surface
Mount Chip Component Test Fixture. The Test
Fixture is designed as a solution for making
measurements in a Shunt-Thru test configuration.
Input and Output launches are on 25 mil alumina
microstrip. Guides on the Midsection Assembly
ensure accurate and repeatable placement of the chip.
De-embedding with TRL / LRM or TOSL Calibration
Standards removes the effect of the test fixture from
your measurements. For custom sized devices, please
contact the factory.