Features
•
Ideal for S-Parameter Measurements, Q and
Resonant Frequency
•
Up to 26.5 GHz Operation (40 GHz available with
ICM Midsections and Mainframes)
•
De-embedding with TRL / LRM or TOSL
Standards
•
Separate spacers for different sized components [5
(0603mm), 15 (0402), 20 (0504), 25 (0603), 40
(0805), 60 (1008), and 80 (1206) mil gaps]
•
Spacers for custom components available upon
request
•
Allows repeatable, non-destructive testing
•
ICM Dura-Contacts for Long Fixture Life
•
Measurement Solution Kits available
•
Total Measurement Solution Kit
•
Shunt-Thru Configurations are also available
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Surface Mount chip capacitors (single or
multi-layered), inductors or resistors can be measured
on Inter-Continental Microwave's (ICM) Surface
Mount Chip Component Test Fixture. The Test
Fixture is designed as a solution for making
measurements in a Series-Thru test configuration.
Input and Output launches are on microstrip material
allowing the customer to select a material that will
match the material used in the end application. Guides
on the fixture ensure accurate and repeatable
placement of the chip. De-embedding with TRL /
LRM or TOSL Calibration Standards removes the
effect of the test fixture from your measurements. For
custom sized devices, please contact the factory.
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Surface Mount Chip Component Test Fixture
Shunt-Thru Configuration
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Features
•
Ideal for S-Parameter Measurements, Q and
Resonant Frequency
•
DC-18 or 26.5 GHz Operation
•
De-embedding with TRL / LRM or TOSL
Standards
•
Separate Assemblies for different sized components
[15 (0402), 25 (0603), 38 (0805), 68 (1008), and
>88 (1206) mil gaps]
•
Allows repeatable, non-destructive testing
•
ICM Dura Contacts for Long Fixture Life
•
Midsection Assembly for custom components
available upon request
•
Complete Test Solutions available (see table)
•
Total Measurement Solution Kit
•
Series-Thru Configurations are also available
|
|
Surface Mount chip capacitors (single or
multi-layered), inductors or resistors can be measured
on Inter-Continental Microwave's (ICM) Surface
Mount Chip Component Test Fixture. The Test
Fixture is designed as a solution for making
measurements in a Shunt-Thru test configuration.
Input and Output launches are on 25 mil alumina
microstrip. Guides on the Midsection Assembly
ensure accurate and repeatable placement of the chip.
De-embedding with TRL / LRM or TOSL Calibration
Standards removes the effect of the test fixture from
your measurements. For custom sized devices, please
contact the factory.
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