Microvue integrated complete automatic measurement solution, integrates RF, microwave and DC measurements into one software interface,
It also takes into account the network resource sharing, data sharing, and provides effective tools to maximize the productivity of hardware equipment
Microvue can also be contracted for custom development of new measurement modules to fit your needs.

DC / RF test solution, multi-functional automatic test software, cross platform, modularization, on-chip test, fixture test
Wavevue Measurement Studio is an integrated measurement solution that unifies RF/microwave and DC
measurements in one software application.
Modules are can be purchased separately or as a package to enable custom configurations for each customer solution.
In addition to the modules listed below, Microvue can also be contracted for custom development of new
measurement modules to fit your needs.
Modules and Features
◢Modules
■ S-Parameters (2 Port and Multiport) ■ DC Bias (Static) ■ I-V Measurements
■ C-V Measurements ■ Power Measurements Scalar ■ Noise Measurements (50Ohm NF)
■ Dynamic (Pulsed) I-V Measurements ■ Wafer Prober Control
◢Features
■ Graphical scripting ■ Comprehensive reporting functions ■ Wafer mapping
■ Integrates seamlessly with Nucleus ■ Fully compatible with WinCal ■Exports to ADS and ICCAP
■ Switch matrix control ■ Data file Streaming and export capability ■Database export
■ Conditional branching in scripts ■ DLL capability for advanced parameter calculation
A single solution for On-wafer and Fixtured Devices

On-wafer Packaged Fixture
Consult of exact more products information,kindly Contact SE TECHNOLOGIES CORP.
info@se-group.com
+886-3-579-9029/+86-21-3214-0732
SE Technologies, See Your Needs!

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