2D Transistor Characterization

2D Transistor Characterization
with Micro-Four Point Probe Test System,
Objective: Rapidly measure transistor behavior of 2D materials
without device fabrication.
Xallent’s micro and nanoscale 4-point probes directly measure the Kelvin resistance, sheet resistance, and transistor transfer and output curves of 2D and thin film materials.

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PRODUCT OVERVIEW

2D Transistor Characterization

with Micro-Four Point Probe Test System

Objective: Rapidly measure transistor behavior of 2D materials without device fabrication.

Xallent’s micro and nanoscale 4-point probes directly measure the Kelvin resistance, sheet resistance, and transistor transfer and output curves of 2D and thin film materials.

Benefits of the micro-four point probe characterization system are as follows:

■ Eliminates laborious and expensive sample preparation steps such as lithography, etching, and metal deposition

■ Reduce learning cycles from weeks to minutes

■ Reduce R&D costs while accelerating time-to-market of new advanced materials and devices

Combined with the Xallent SAKYIWA NanoProber, the 4-point probes allow for rapid electrical tests on flakes, un-patterned, and patterned wafers at the micro and nanoscale level.

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