QuadProII Automatic Resistivity Measurement System

Lucas-Signatone has designed and built 4 point probing equipment for measuring the sheet resistivity of  semiconductors since 1968. 

More recently, the 4 point probe methodology has been applied to a variety of material research applications measuring

thin films on a variety of substrates.  The QuadProII is designed to meet the demands of research on wafers, thin films, 

solar cells and a variety of applications.

◢Application of QuadProII

  ■ measure the sheet resistance, resistivity or thickness of the test sample.

  ■ ASTM standard F84 - F89 is adopted; QuadProII  accurately map the surface of the test sample.

  ■  The four point probe measurement system has been recognized as the best method for measuring thin layers of 

     conductive or semiconductive materials.

◢  Features

   ■ Average resistivity, Standard deviation of resistivity, Sheet resistance and standard deviation of sheet resistance

   ■  TCR (temperature coefficient of resistance)

   ■ Use automatic temperature controller, temperature controlled sample stage (optional) and 

      instrument to measure resistance temperature coefficient.

   ■The measurement results can be graphically expressed in two-dimensional (2D) or three-dimensional (3D).

Consult of exact more products information,kindly Contact  SE TECHNOLOGIES CORP.

   info@se-group.com

   +886-3-579-9029/+86-21-3214-0732

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