GTL5050-Rotation Probing Platform

Rotation Probing Platform

The GTL5050 probe station was designed to address the difficult task of 2 sided probing. Instead of trying to probe with a board mounted vertically. The GTL5050 is constructed in such a way that it is actually 2 probe stations in one. A topside probe station and a bottom side probe station with the unique ability to rotate the entire probe station 180 degrees allowing quick setup and pre-configuration of the probes and test structures on both the top and bottom. Bottom side adjustments are easily made using Joystick controlled motorized positioners.

◢Features

  ■Top to Bottom measurements    

  ■The unique board clamping system easily accommodates both Planar and Three-dimensional structures like 

    motherboards with daughter cards.

  ■Test boards up to 30 inches by 20 inches

  ■Handles multiple board interconnects, BGA packages, Test Sockets, Contactors, and more

  ■Joy-stick controlled remote positioners for precise bottom-side probe placement

  ■Bottom side Zoom Lens and CCD camera

  ■Optional Micro-CCD camera offers visual access and probe placement in confined spaces

  ■Accommodates multiple probe positioners on top and bottom for crosstalk measurements

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